SSO NEWSSolid State Optronics
Form C SSRs: The Future of ATE and Semiconductor Testing
The Solid State Optronics family of Form C SSRs address the chronic problem presented by Electro-Mechanical Relays in high volume ATE and Semiconductor Test applications.
Mechanical relays have inherent characteristics of contact bounce, contact resistance degradation, limited operating life, magnetic interference, and contact thermal EMF generation, that in turn cause production line yield loss and downtime, and PCB and test circuit design complications. Solid State Optronics Form C SSRs provide a robust solution to these issues.
Key Benefits
Drop-in replacement for legacy EMRs in ATE Test Boards
High Reliability — 1 Billion+ Switch Actuations Operating Life
Eliminate an insidious cause of tester downtime — EMR failures
True, Integrated Break-Before-Make open-close switching
